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Li X, Li J, Jing J, et al. Integrated IVUS-OCT Imaging for Atherosclerotic Plaque Characterization. IEEE J Sel Top Quantum Electron. 2014;20(2):7100108doi: 10.1109/JSTQE.2013.2274724.
Li, X., Li, J., Jing, J., Ma, T., Liang, S., Zhang, J., Mohar, D., Raney, A., Mahon, S., Brenner, M., Patel, P., Shung, K. K., Zhou, Q., & Chen, Z. (2014). Integrated IVUS-OCT Imaging for Atherosclerotic Plaque Characterization. IEEE journal of selected topics in quantum electronics : a publication of the IEEE Lasers and Electro-optics Society, 20(2), 7100108. https://doi.org/10.1109/JSTQE.2013.2274724
Li, Xiang, et al. "Integrated IVUS-OCT Imaging for Atherosclerotic Plaque Characterization." IEEE journal of selected topics in quantum electronics : a publication of the IEEE Lasers and Electro-optics Society vol. 20,2 (2014): 7100108. doi: https://doi.org/10.1109/JSTQE.2013.2274724
Li X, Li J, Jing J, Ma T, Liang S, Zhang J, Mohar D, Raney A, Mahon S, Brenner M, Patel P, Shung KK, Zhou Q, Chen Z. Integrated IVUS-OCT Imaging for Atherosclerotic Plaque Characterization. IEEE J Sel Top Quantum Electron. 2014 Mar;20(2):7100108. doi: 10.1109/JSTQE.2013.2274724. PMID: 24771992; PMCID: PMC3996710.
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